JESD22-A110 is an internationally recognized high acceleration temperature humidity stress testing (HAST) standard, specifically designed to quickly evaluate the corrosion resistance and long-term reliability of electronic components (especially chips) under the simultaneous effects of high temperature, high humidity, and voltage bias.
Two standard testing conditions:
Condition A (130 ° C/85% RH, 96 hours) is the industry's preferred test condition: this is the standard testing condition defined in the JESD22-A110 standard and also the preferred solution for the vast majority of semiconductor manufacturers when conducting product quality certification. Its high acceleration factor can effectively expose potential defects in the shortest possible time (usually 96 hours).
2. Applicable scenarios for condition B (110 ° C/85% RH, 264 hours): mainly used for devices with high power consumption and easy self heating. This is because in a testing environment of 130 ° C, the heat generated by the device's own operation may cause its actual temperature to far exceed the maximum junction temperature specified in the specifications, resulting in non real failure. Therefore, choosing a milder 110 ° C condition and appropriately extending the testing time to 264 hours is a more reasonable evaluation method.
Difference between bias and no bias under JESD22 testing conditions:
The main difference between the core feature of HAST testing with bias and another common test without bias (JESD22-A118, UHAST) is:
JESD22-A110 (HAST): During testing, the chip is powered on to primarily assess the combined effect of "electrochemistry+humidity".
JESD22-A118 (UHAST): During testing, there is no power supply, mainly assessing the "moisture absorption" and "delamination" risks of the packaging material itself
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