UP-2000-M Touch Screen Tensile Tester for Thin Metal Strip and Foil Single Column Universal Testing Machine

A: Thin metal strip, copper foil, aluminium sheet, thin iron strip and stamped metal shims. It is built for thin metal samples — not for thick solid bars, which need a much higher force capacity and a dual-column frame.

A: Yes, for the force measurement. The system supports yield point detection and reports upper/lower yield strength on materials with a yield plateau, or 0.2% proof strength (Rp0.2) on materials without one. Note that proof strength is determined from extension over the gauge length, so a clip-on extensometer is required for a standards-compliant result.

A: Sample edge crushing and slipping during clamping. Serrated jaws concentrate pressure on a thin edge, which can start a crack at the clamp and shift the fracture out of the gauge length. Our matched jaws distribute clamping pressure evenly to hold the strip securely while protecting the edge.

A: Yes. Stamping factories use it to verify the mechanical properties of raw coil and strip before mass production, which helps avoid forming failures, cracking and scrap caused by out-of-specification material.

A: It is designed for tensile testing to ASTM E8/E8M and ISO 6892-1, the references most commonly called up by metal material laboratories and hardware manufacturers. ASTM E4 covers force calibration of the machine.

A: Select capacity from your expected maximum force, not from the sample thickness. Copper and aluminium foil break at forces far below 1 kN, so a 1 kN or 2 kN load cell is the right choice.

A: Yes. The UP-2000-P, UP-2000-M, UP-2000-F and UP-2000-A use the same single-column main unit, so you can switch applications by changing the matched grips and selecting the corresponding preset test program on the touch screen. Each machine is supplied with one set of standard grips; additional grips are purchased separately. Changing grips does not change the load capacity of the tester, and frequent grip removal may affect specimen alignment and data repeatability.